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Name of the instruments
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Make and Model
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Atomic Force Microscope (AFM)
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NT-MDT, Russia, Solver Pro-47
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Colorimeter
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Hunter Lab., USA, Color Flex
|
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Differential Scanning Calorimeter (DSC)
|
TA Instruments, USA, Q 10
|
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Dynamic Contact Angle (DCA)
|
Dataphysics, Germany, DCAT21
|
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Electrochemical Analyzer (ECA)
|
CH Instruments, USA, Model 680B
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Elemental Analyzer (C,H,N,S and O)
|
Elementar, Germany, Vario EL III
|
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Ellipsometer
|
Nano-View Inc., Korea, SE MEG 1000-VIS
|
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Fourier Transform Infrared Spectroscopy (FTIR)
|
Shimadzu Corpn., Japan, IR-Prestige 21
|
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Gel Permeation Chromatography (GPC)
|
Waters Corporation, USA
|
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Impedance Analyzer
|
Novocontrol Tech, Germany, ALPHA ATB
|
|
Inductively Coupled Plasma Optical Emission Spectrophotometer (ICP-OES)
|
Perkin Elmer, USA; Optical 2100DV ICP-OES
|
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Light Scattering
|
Malvern Instrumrnts, UK, Nano ZS
|
|
Liquid Chromatography-Mass Spectrometry (LCMS)
|
Thermo Scientific, USA, Ultimate 3000
|
|
Mercury Porosity Meter
|
Thermo electronics, Italy, PASAL 440
|
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Machinery Fault Simulator (MFS)
|
Spectra Quest, Inc.USA,
|
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Microwave Reaction System
|
Anton Paar, Austria, Multiwave 3000
|
|
Optical Contact Angle (OCA)
|
Dataphysics, Germany, OCAH 230
|
|
PCB Prototyping
|
Germany, LPKF PCB Prototyping Machine
|
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Pulse Analyzer
|
OROS S.A. France, OR 38/ORS
|
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Scanning Electron Microscope (SEM)
|
Jeol, Japan, JSM-6390LV
|
|
Spectroflurophotometer
|
Shimadzu, Japan, RF-5301 PC
|
|
Thermo Gravimetric Analyzer (TGA)
|
Shimadzu, Japan, DTG-60
|
|
Universal Testing Machine
|
Instron, UK, 8801
|
|
UV-Visible Spectrophotometer
|
Perkin Elmer, USA; Lambda-25
|
|
Polishing Machine
|
Struers, Denmark, Labopol-5
|
| XRD |
Rigaku, Japan, SmartLab 9kW
|