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Central Instrumentation Facility (CIF)


Make and model of Instruments available at the Central Instrumentation Facility (CIF) are given below:


Name of the instruments

Make and Model

Atomic Force Microscope (AFM)

NT-MDT, Russia, Solver Pro-47


Hunter Lab., USA, Color Flex

Differential Scanning Calorimeter (DSC)

TA Instruments, USA, Q 10

Dynamic Contact Angle (DCA)

Dataphysics, Germany, DCAT21

Electrochemical Analyzer (ECA)

CH Instruments, USA, Model 680B

Elemental Analyzer (C,H,N,S and O)

Elementar, Germany, Vario EL III


Nano-View Inc., Korea, SE MEG 1000-VIS

Fourier Transform Infrared Spectroscopy (FTIR)

Shimadzu Corpn., Japan, IR-Prestige 21

Gel Permeation Chromatography (GPC)

Waters Corporation, USA

Impedance Analyzer

Novocontrol Tech, Germany, ALPHA ATB

Inductively Coupled Plasma Optical Emission Spectrophotometer (ICP-OES)

Perkin Elmer, USA; Optical 2100DV ICP-OES

Light Scattering

Malvern Instrumrnts, UK, Nano ZS

Liquid Chromatography-Mass Spectrometry (LCMS)

Thermo Scientific, USA, Ultimate 3000

Mercury Porosity Meter

Thermo electronics, Italy, PASAL 440

Machinery Fault Simulator (MFS)

Spectra Quest, Inc.USA,

Microwave Reaction System

Anton Paar, Austria, Multiwave 3000

Optical Contact Angle (OCA)

Dataphysics, Germany, OCAH 230

PCB Prototyping

Germany, LPKF PCB Prototyping Machine

Pulse Analyzer

OROS S.A. France, OR 38/ORS

Scanning Electron Microscope (SEM)

Jeol, Japan, JSM-6390LV


Shimadzu, Japan, RF-5301 PC

Thermo Gravimetric Analyzer (TGA)

Shimadzu, Japan, DTG-60

Universal Testing Machine

Instron, UK,  8801

UV-Visible Spectrophotometer

Perkin Elmer, USA; Lambda-25

Polishing Machine

Struers, Denmark, Labopol-5


Rigaku, Japan, SmartLab 9kW

Instruments Detail

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Current News

Notices and Circular

Posted Date : 1-Aug-2018 09:22 PM

Instruments Under Maintenance

Posted Date : 17-Aug-2017 04:07 AM

New Facility Included

Posted Date : 16-Aug-2017 03:57 AM